SEM

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Across
  1. 5. Device that captures secondary or backscattered electrons.
  2. 7. Focused stream of electrons.
  3. 9. Output information collected from the specimen.
  4. 11. Process of producing visual output from electron interactions.
  5. 12. Negatively charged particle used in SEM.
  6. 13. Enclosure where electron–specimen interactions occur.
  7. 14. Main lens that focuses the electron beam.
Down
  1. 1. Radiation emitted when high-energy electrons strike atoms.
  2. 2. Sample being analyzed in SEM.
  3. 3. Condition required to prevent scattering inside the SEM chamber.
  4. 4. Instrument that forms images using electrons instead of light.
  5. 6. Ability to distinguish two closely spaced points.
  6. 8. Process of enlarging the apparent size of the image.
  7. 9. Outermost region studied in SEM imaging.
  8. 10. Electromagnetic component used to bend or focus beams.