MVC: Semiconductor

4. Semiconductor company co-founded by Gordon Moore and Robert Noyce
6. Testing performed at the operating wavelength
7. Sudden transfer of electrical charge between objects at different potentials
12. 193nm, 213nm, or 248nm, for instance
13. Process used to project patterns onto a wafer
14. Patterned template used in lithography to transfer circuit designs onto a wafer
15. Inspection technique based on reflected light
17. Next-generation development project for hybridized sensor technology
19. 13.5nm, e.g.
21. Base substrate from which chips are fabricated
22. Surface defect caused by mechanical damage, commonly detected during wafer inspection

1. Protective membrane suspended above a photomask
2. Image sensor technology using active pixel circuitry
3. Codename of a large-format camera developed for EUV mask inspection
5. Codename of a high-performance wafer inspection line-scan camera
8. Inspection technique based on scattered light
9. Tiny contaminant that can ruin a semiconductor device
10. World's largest chip manufacturer
11. Intended geometric feature printed onto a device or mask
14. DUV mask inspection camera named after a Canadian canal
16. Imaging modality based on scanning an object, often used to inspect photomasks
18. Chip manufacturing step that selectively removes material
20. Image sensor technology, or, looped into an email chain