SEM

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Across
  1. 5. Process of producing visual output from electron interactions.
  2. 7. Platform where the specimen is mounted inside the SEM.
  3. 8. Sample being analyzed in SEM.
  4. 10. Process of enlarging the apparent size of the image.
  5. 11. Negatively charged particle used in SEM.
  6. 13. Focused stream of electrons.
  7. 14. Condition required to prevent scattering inside the SEM chamber.
Down
  1. 1. Outermost region studied in SEM imaging.
  2. 2. Main lens that focuses the electron beam.
  3. 3. Enclosure where electron–specimen interactions occur.
  4. 4. Electromagnetic component used to bend or focus beams.
  5. 6. Radiation emitted when high-energy electrons strike atoms.
  6. 8. Output information collected from the specimen.
  7. 9. Device that captures secondary or backscattered electrons.
  8. 10. Instrument that forms images using electrons instead of light.
  9. 12. Ability to distinguish two closely spaced points.