Across
- 2. Conductive layer added to non-conductive samples before imaging
- 3. Required environment that reduces electron scattering by air molecules
- 5. Surface landscape information such as hills, valleys, and roughness
- 7. High-resolution SEM that uses a field emission gun
- 9. High-energy electrons used for atomic number contrast
- 12. Beam used in SEM to scan the sample surface
- 14. Smallest feature size that can still be distinguished clearly
- 15. Line-by-line scanning pattern in SEM
- 16. Full first word in SEM
Down
- 1. Low-energy electrons used mainly for topographical imaging
- 4. Making an image appear larger by scanning a smaller area
- 6. Final lens that focuses the beam before it reaches the sample
- 8. Technique used for elemental composition analysis in SEM
- 10. Electromagnetic parts that focus and control the electron beam
- 11. Time the beam stays on each pixel
- 13. Image distortion caused by electron accumulation on insulating samples
- 16. Part that supports and positions the sample
