unit-5

3. It is defined in terms of controllability and observability for any circuit/device
4. The current responsible for static power dissipation in ratioed logic circuit.
6. A class of logic circuit that offers the possibility of recycling or reusing some of the energy drawn from the power supply.
8. Technique for design low power VLSI circuit by varying substrate bias voltage of PMOS & NMOS.
11. The measure of ease with which the controller can establish a specific signal value at each node.
12. The variant of an architecture used in specific application for high performance.
13. Technique of designing low power architecture by using multiple threshold voltages.
15. Used to design low power VLSI architecture when leakage is present

1. In absence of leakage this architecture offer higher performance as compared to pipelining.
2. Spurious signal transition are known as ----
5. The measure of ease with which one can determine the signal value at any logic node in the circuit.
7. The technique in which access circuits are physically inserted to make system more testable.
9. Often used technique for testing fabrication defects.
10. Delay fault is an example of -------
14. The testing technique in which parts of circuit are used to test the circuit itself.